Resistance Post-Trim Drift Index for Film Resistors to be Trimmed

نویسنده

  • Stuart M. Jacobsen
چکیده

This paper discusses a method to evaluate post-trim drifts of laser trimmed film resistor. Based on mathematical flux field computations a drift index is deduced. This index as a part of mathematical laser trim simulations gives an imagination of expected post-trim drifts already on design stage and thereby a method to improve precision and reliability of hybrid IC’s by trim strategy design.

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تاریخ انتشار 2002