Ieee Vlsi Test Symposium
نویسندگان
چکیده
منابع مشابه
IEEE VLSI Test Symposium 1997, pp. 188-195 Fast Algorithms For Static Compaction of Sequential Circuit Test Vectors
Two fast algorithms for static test sequence compaction are proposed for sequential circuits. The algorithms are based on the observation that test sequences traverse through a small set of states, and some states are frequently re-visited throughout the application of a test set. Subsequences that start and end on the same states may be removed if necessary and su cient conditions are met for ...
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