Speeding up SAT Based ATPG for Logic Veri cation by Recursive Learning
نویسندگان
چکیده
Recursive Learning (RL) is a circuit-structure-based method for computing all necessary assignments. Recursive learning technique can be combined with diierent CAD algorithms and techniques in testing, veriication and optimization. In particular, it is used for Automatic test pattern generation(ATPG) which has been applied to many areas of logic synthesis and formal veriication including combinational veriication and logic minimization. Satissa-bility (SAT)-based-ATPG is one of the most eecient algorithms in testing. In this project, we investigate applying recursive learning to the SAT-based-ATPG. We then use the revised the SAT-based-ATPG for combinational logic veriication. The SAT-based-ATPG with global implication heuristics (iterated global implications) is very eecient and it does not seem to leave much room for improvement. However, our preliminary results show that adding recursive learning information does speed up the SAT-base-ATPG for combinational logic veriication.
منابع مشابه
Learning Techniques for Automatic Test Pattern Generation using Boolean Satisfiability
Automatic Test Pattern Generation (ATPG) is one of the core problems in testing of digital circuits. ATPG algorithms based on Boolean Satisfiability (SAT) turned out to be very powerful, due to great advances in the performance of satisfiability solvers for propositional logic in the last two decades. SAT-based ATPG clearly outperforms classical approaches especially for hard-to-detect faults. ...
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