Frequency-Scalable Nonlinear-Transmission-Line-Based Vector Network Analyzers

An overview of the high-frequency reflectometer technology deployed in Anritsu’s VectorStar Vector Network Analyzer (VNA) family is given, leading to a detailed description of the architecture used to extend the frequency range of VectorStar into the high millimeter waves. It is shown that this technology results in miniature frequency-extension modules that provide unique capabilities such as direct connection to wafer probes, dense multi-port measurements, test-port power leveling, enhanced raw directivity, and reduced measurement complexity when compared with existing solutions. These capabilities, combined with the frequency-scalable nature of the reflectometers provide users with a unique and compelling solution for their current and future high-frequency measurement needs.