In-situ characterization of rapid crystallization of amorphous CoFeB electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing
نویسندگان
چکیده
electrodes in CoFeB/MgO/CoFeB junctions during thermal annealing W. G. Wang, J. Jordan-sweet, G. X. Miao, C. Ni, A. K. Rumaiz, L. R. Shah, X. Fan, P. Parsons, R. Stearrett, E. R. Nowak, J. S. Moodera, and J. Q. Xiao Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716, USA IBM T.J. Watson Research Center, Yorktown Heights, New York 10598, USA Francis Bitter Magnet Laboratory, MIT, Cambridge, Massachusetts 02139, USA Department of Materials Science and Engineering, University of Delaware, Newark, Delaware 19716, USA National Synchrotron Light Source, Brookhaven National Laboratory, Upton, New York 11973, USA
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