Transparent Oxide TFTs Fabricated by Atomic Layer Deposition(FA2386-11-1-114052)
نویسنده
چکیده
Purpose and Background: In recent years, the application of zinc oxide (ZnO) thin films as an active channel layer in TFTs has become of great interest owing to their specific characteristics. ZnO is transparent in the visible wavelengths region because of its wide band gap (~3.37eV), and the ability to fabricate good quality films over large areas at low temperature suggests the compatibility of ZnO films with plastic or other flexible substrates. Higher field-effect mobility of ZnO TFTs than a-Si:H TFTs has been recently demonstrated. However, reliability for electrical stress is one of serious problems in their mass production. An atomic layer deposition (ALD) method is one of the thin film fabrication technologies, which attracts much attention in LSI industry. The film deposited by ALD has additional features of accurate thickness control, high conformity, and uniformity over large areas, because of the alternating gas supply.
منابع مشابه
Final Report FA2386-10-1-04063 High performance and highly reliable ZnO Thin Film Transistor fabricated by Atomic Layer Deposition for Next Generation Displays
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