Testing domino circuits in SOI technology
نویسندگان
چکیده
The proliferation of both Partially Depleted SiliconOn-Insulator (PD-SOI) technology and domino circuit styles has allowed for increases in circuit performance beyond that of scaling traditional bulk CMOS static circuits. However, interactions between dynamic circuit styles and PD-SOI complicate testing. This paper describes the issues of testing domino circuits fabricated in SOI technology and new tests are proposed to address the interactions. A fault modeling analysis is described which demonstrates that the overall fault coverage can be improved beyond that of traditional testing of domino circuits in bulk technology.
منابع مشابه
Testing Domino Circuits in SO1 Technology
The proliferation of both Partially Depleted SiliconOn-Insulator (PD-SOI) technology and domino circuit styles has allowed for increases in circuit performance beyond that of scaling traditional bulk CMOS static circuits. However, interactions between dynamic circuit styles and PD-SO1 complicate testing. This paper describes the issues of testing domino circuits fabricated in SO1 technology and...
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