Applications of Aberration Corrected TEM and Exit Wavefunction Reconstruction to Materials Science
نویسندگان
چکیده
The initial announcement of two successful alternative geometries of successful aberration correctors for TEM [1] and STEM [2] in 1997 has led to significant improvements in spatial resolution and the availability of higher probe current densities for analysis. There are now in excess of 400 aberration correctors installed worldwide. The Oxford-JEOL 2200MCO was the first instrument fitted with two aberration correctors, installed in 2003 [3] and this instrument has more recently been upgraded with a monochromated source [4].
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