An Accurate Timing Model for Nano CMOS Circuit Considering Statistical Process Variation
نویسندگان
چکیده
Process variation has more significant impact on circuit performance as technology develops to nano scale. It is therefore necessary to evaluate chip performance using statistical timing analysis rather than deterministic static timing analysis. This paper first evaluates the impact of single extrinsic fluctuation on circuit performance based on the rigorously derived propagation delay model. The parameter fluctuations are characterized and a novel statistical approach is developed to evaluate the effect of simultaneous variations in multiple process parameters. The probability distribution of propagation delay is calculated and timing yield is estimated.
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