Immediate Neighbor Difference IDDQ Test (INDIT) for Outlier Identification
نویسندگان
چکیده
Increasing values and spread in leakage current makes it impossible to distinguish between faulty and fault-free chips using single threshold method. Neighboring chips on a wafer have similar fault-free properties. By obtaining differences in IDDQ values it is possible to discriminate faulty dice. In this paper, a technique in which comparison of IDDQ of a die with that of its neighboring dice on the wafer is evaluated. The analysis based on the SEMATECH test data is presented.
منابع مشابه
Use of Multiple IDDQ Test Metrics for Outlier Identification
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to increased spread in the distribution. In this paper, the concept of current ratio is extended to exploit waferlevel spatial correlation. Two metrics – current ratio and neighbor current ratio – are combined to screen o...
متن کاملOn Comparison of NCR Effectiveness with a Reduced I{DDQ} Vector Set
IDDQ test-based outlier rejection becomes difficult for deep sub-micron technology chips due to increased leakage and process variations. The use of Neighbor Current Ratio (NCR) that uses wafer-level spatial correlation for identifying outlier chips has been proposed earlier as a means of coping with these issues. Due to the slow speed of IDDQ test, there is a strong motivation to reduce the nu...
متن کاملCROWNE: Current Ratio Outliers with Neighbor Estimator
Increased leakage and process variations make distinction between fault-free and faulty chips by IDDQ test difficult. Earlier the concept of Current Ratios (CR) was proposed to screen defective (outlier) chips. However, it is not capable of catching certain defects. Neighboring chips on a wafer have similar fault-free parameters that are correlated through the underlying fabrication process. Ba...
متن کاملIDDQ Outlier Screening through Two-Phase Approach: Clustering-Based Filtering and Estimation-Based Current-Threshold Determination
We propose a novel IDDQ outlier screening flow through a two-phase approach: a clustering-based filtering and an estimation-based current-threshold determination. In the proposed flow, a clustering technique first filters out chips that have high IDDQ current. Then, in the current-threshold determination phase, device-parameters of the unfiltered chips are estimated based on measured IDDQ curre...
متن کاملEvaluation of Statistical Outlier Rejection Methods for IDDQ Testing
The quiescent current testing (IDDQ testing) for CMOS ICs provides several advantages over other testing methods. However, the future of IDDQ testing is threatened by increased sub-threshold leakage current for new technologies. The conventional pass/fail limit setting methodology cannot survive in its present form. In this paper we evaluate two statistical outlier rejection methods – the Chauv...
متن کامل