Applications of Scanning Electron Microscopy (sem) in Nanotechnology and Nanoscience

Among the techniques of electron microscopy, scanning electron microscopy (SEM) represents a high-performance method of investigating structures and devices in the domain of nanometer dimensions. This paper is a synthesis of the possible applications of SEM in the investigation of the nanometer domain, nanomaterials and nanotechnologies. It includes the results of the authors’ research work as well as a review of the literature regarding the study and analysis of nanostructured materials, nanotechnologies based on SEM, and the current trends in this cutting-edge field. Our analysis and investigations presented in the paper represent contributions on the studies and researches regarding to some nanostructured materials: Zn layers electrochemically deposited, Au films deposited in vacuum, carbon nanotubes, organic nanomaterials obtained by sol-gel method.