Effective IDDQ Testing method to identify the fault in Low-Voltage CMOS Circuits
نویسنده
چکیده
A novel voltage delta IDDQ test method is presented for circuits working in low voltages. The proposed method can eliminate the any contribution from leakage due to the usage of differential IDDQ test method. The proposed method is successfully implemented on 1-bit, 32-bit and 100-adders circuits on IBM 130 nm technology and can detect faulty circuit only if short is activated from the applied logic input. Defining two voltage levels are critical for testing and will depend on the circuit under test. Keywords—IDDQ testing;Low voltage testing; voltage delta IDDQ
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تاریخ انتشار 2015