Memory BIST
نویسندگان
چکیده
منابع مشابه
A New Approach to Programmable Memory Built-In Self Test Scheme
The design and architecture of a reconngurable memory BIST unit is presented. The proposed memory BIST unit could accommodate changes in the test algorithm with no impact to the hardware. Diierent types of march test algorithms could be realized using the proposed memory BIST unit and the proposed architecture allows addition and elimination of the memory BIST components. Therefore memories wit...
متن کاملComprehensive Study on Designing Memory BIST: Algorithms, Implementations and Trade-offs
1. Preface This report presents a compressive study on designing memory BIST. The study covers motivation behind memory BIST, algorithm of different test patterns, surveys of current memory BIST architecture, and discussion of various implementation issues. It is my best intention that this report will serve as a knowledge base for future design in memory BIST. The remainder of this report is o...
متن کاملFully Programmable Memory BIST for Commodity DRAMs
3⁄4 In order to accomplish a high speed test on low speed Automatic Test Equipment (ATE), a new instruction based, fully programmable memory, Built-in Self-Test (BIST) is proposed. The proposed memory BIST generates a high speed internal clock signal by multiplying the external low speed clock signal from the ATE. For maximum programmability and small area overhead, the proposed BIST receives t...
متن کاملA New Framework For Automatic Generation, Insertion and Verification of Memory Built-In Self Test Units
The design and architecture of a memory test synthesis framework for automatic generation, insertion and veriication of memory BIST units is presented. We use a building block architecture which results in full customization of memory BIST units. The exibility and eeciency of the framework are demonstrated by showing that memory BIST units with diierent architecture and characteristics could be...
متن کاملA Microcode-Based Memory BIST Implementing Modified March Algorithm
A new microcode-based BIST(Built-In Self Test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting DOF(Degree of Freedom) concept to detect ADOFs(Address Decoder Open Faults) on top of conventional stuck faults. Furthermore it is shown that the march BIST modified can capture a few NPSFs(Neighbor...
متن کاملA new system for BIST architecture generation for embedded memories in SoCs
The paper is aimed at a new system for generation of suitable BIST (Built-in Self-Test) blocks for effective testing of multiple memories integrated in a SoC (System on Chip). Incoming technologies, chip complexity and increasing clock frequencies give new challenges for testing huge number of embedded SoC memories. SoCs have to be tested after their manufacturing and always during their life-t...
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