Technique for the metrology calibration of a Fourier transform spectrometer.
نویسندگان
چکیده
A method is presented for using a Fourier transform spectrometer (FTS) to calibrate the metrology of a second FTS. This technique is particularly useful when the second FTS is inside a cryostat or otherwise inaccessible.
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ورودعنوان ژورنال:
- Applied optics
دوره 47 32 شماره
صفحات -
تاریخ انتشار 2008