Photocurrents in a Single InAs Nanowire/Silicon Heterojunction.
نویسندگان
چکیده
We investigate the optoelectronic properties of single indium arsenide nanowires, which are grown vertically on p-doped silicon substrates. We apply a scanning photocurrent microscopy to study the optoelectronic properties of the single heterojunctions. The measured photocurrent characteristics are consistent with an excess charge carrier transport through midgap trap states, which form at the Si/InAs heterojunctions. Namely, the trap states add an additional transport path across a heterojunction, and the charge of the defects changes the band bending at the junction. The bending gives rise to a photovoltaic effect at a small bias voltage. In addition, we observe a photoconductance effect within the InAs nanowires at large biases.
منابع مشابه
Performance Study and Analysis of Heterojunction Gate All Around Nanowire Tunneling Field Effect Transistor
In this paper, we have presented a heterojunction gate all around nanowiretunneling field effect transistor (GAA NW TFET) and have explained its characteristicsin details. The proposed device has been structured using Germanium for source regionand Silicon for channel and drain regions. Kane's band-to-band tunneling model hasbeen used to account for the amount of band-to...
متن کاملTrap-assisted tunneling in Si-InAs nanowire heterojunction tunnel diodes.
We report on the electrical characterization of one-sided p(+)-si/n-InAs nanowire heterojunction tunnel diodes to provide insight into the tunnel process occurring in this highly lattice mismatched material system. The lattice mismatch gives rise to dislocations at the interface as confirmed by electron microscopy. Despite this, a negative differential resistance with peak-to-valley current rat...
متن کاملNanowire Growth and Device Fabrication n-type InAs NWs are grown on Si <111> by selective area epitaxy within e-beam patterned SiOx openings by metal-organic chemical vapor deposition
In this paper we present vertical tunnel diodes and tunnel FETs (TFETs) based on III-V–Si nanowire heterojunctions. We experimentally demonstrate InAs–Si Esaki tunnel diodes with record high currents of 6 MA/cm at 0.5 V in reverse bias. Furthermore, we have fabricated vertical InAs–Si nanowire TFETs with gate-all-around architecture and high-k dielectrics. The InAs–Si combination allows achievi...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- ACS nano
دوره 9 10 شماره
صفحات -
تاریخ انتشار 2015