Transient x-ray diffraction used to diagnose shock compressed Si crystals on the Nova laser
نویسندگان
چکیده
Transient x-ray diffraction is used to record time-resolved information about the shock compression of materials. This technique has been applied on Nova shock experiments driven using a hohlraum x-ray drive. Data were recorded from the shock release at the free surface of a Si crystal, as well as from Si at an embedded ablator/Si interface. Modeling has been done to simulate the diffraction data incorporating the strained crystal rocking curves and Bragg diffraction efficiencies. Examples of the data and post-processed simulations are presented. © 1999 American Institute of Physics. @S0034-6748~99!62601-6#
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