Fully-Automated 3D Metrology and Defect Analysis with High-Resolution 300 kV Microfocus Computed Tomography

نویسنده

  • Oliver Brunke
چکیده

With industrial X-ray computed tomography (CT), even low-contrast defects in cast parts, such as cracks, pores and blowholes, can be localized and measured in three dimensions. Analysis of the defects can be performed using either multi-positional 2D cross-section planes or the 3D volume view. Additionally, 3D metrology with CT becomes more and more an effective tool for many tasks in production process monitoring such as the manufacture of plastics, metal castings and precision components like injection nozzles. Particularly complex part geometries with inaccessible or hidden features can be measured with CT in many cases faster than with conventional Coordinate Measuring Machines (CMMs). This paper shows failure analysis and metrology tasks automatically performed on a new GE CT system optimized for stable and reproducible CT scans and equipped with a new unipolar 300 kV microfocus X-ray tube, new CT software for fully automated data acquisition, volume processing and 3D evaluation capability.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Advanced Non-Destructive Testing by High Resolution Computed Tomography for 3D analysis of Automotive Components

For a huge variety of inspection tasks, high resolution computed tomography (CT) has become a powerful inspection tool. CT systems are applied in failure analysis as well as in 3D Metrology. Especially for complex automotive components with hidden internal structures CT offers a wide expansion of customary two-dimensional X-ray inspection capabilities. Depending on the sample size and the mater...

متن کامل

Investigation of I.C. samples using X-ray computer tomography

Structure complexity combined with high integration level in microelectronic industry is making the analysis more and more difficult. Non Destructive Analysis of either new semiconductor generation (e.g BGA, Flipchip) or double-sided printed circuit boards, is becoming very difficult as most of the critical structure features are hidden. Although 2D-X-rays inspection is still the most popular n...

متن کامل

Investigation of the application of phase contrast imaging using a point X-ray source to industrial non-destructive testing.

X-Tek Systems, a division of Nikon Metrology UK, designs, develops and manufactures microfocus X-ray radiography and computed tomography systems for industrial non-destructive testing. The range of X-ray acceleration voltages of its current standard products is 130-450 kV. It is widely known that X-ray images can be created using phase contrast formed by the natural propagation of X-rays. Simul...

متن کامل

Advanced Applications of Computed Tomography by Combination of Different Methods

Advanced applications of materials need sophisticated measurement methods for research, process development and quality control. X-ray Computed Tomography (CT) is a very powerful method for non-destructive testing of materials. A CT-scanner generates a series of X-ray attenuation measurements, which are used to produce computed reconstructed images of an object. In the last years 3D-CT systems ...

متن کامل

Methods to evaluate the performance of kilovoltage cone-beam computed tomography in the three-dimensional reconstruction space

Background: Cone-beam computed tomography (CBCT) scanners for image-guided radiotherapy are in clinical use today, but there has been no consensus on uniform acceptance to verify the CBCT image quality yet. The present work proposed new methods to fully evaluate the performance of CBCT in its three-dimensional (3D) reconstruction space. Materials and Methods: Compared to the traditional methods...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2012