Effect of autoclave test on anisotropic conductive joints

نویسندگان

  • C. W. Tan
  • Y. C. Chan
  • N. H. Yeung
چکیده

This paper reports that the stress-corrosion cracking induced by autoclave test condition reduces the mechanical strength of anisotropic conductive joints and also increases the contact resistance by allowing more moisture to reach the aluminium metallization. The use of anisotropic conductive joints with bumpless chips allows a reduction in the costs of the flip chip bonding process. The epoxy-based anisotropic conductive adhesive film (ACF) absorbs moisture and experiences hygroscopic swelling, hence degrading adhesion strength and elasticity in hazardous environments, e.g. if moisture at high vapour pressure, and test temperature near to its glassy temperature (Tg) are applied. Contact resistances also show an increasing trend that is similar to that typical of a corrosion process. It is most probably due to the formation of an oxidation layer on top of the aluminium metallization and to the hygroscopic swelling of the ACF. The elastic properties of ACF joints reduce by about 50% after 384 h test time. In this study, 336 h of autoclave test is the critical test duration to affect the electrical and mechanical properties of an ACF joint. 2002 Elsevier Science Ltd. All rights reserved.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Behaviour of anisotropic conductive joints under mechanical loading

Anisotropic conductive films (ACFs) received a great deal of attention in recent years for interconnection applications in electronic packaging. This paper reports the behaviour of ACF joints under various mechanical loading, i.e., die shear and cyclic fatigue in shear. The mechanical behaviour of ACF joints that have been exposed to environmental effects, i.e., high moisture and elevated tempe...

متن کامل

Reliability of Anisotropic Conductive Adhesive Joints in Electronic Packaging Applications

New interconnection materials are always necessary as a result of evolving packaging technologies and increasing performance and environmental demands on electronic systems. In particular, anisotropic conductive adhesives (ACAs) have gained popularity as a potential replacement for solder interconnects. Despite numerous benefits, ACA-type packages pose several reliability problems. During the l...

متن کامل

Effect of drop impact energy on contact resistance of anisotropic conductive adhesive film joints

The contact resistances investigated in this study of anisotropic conductive adhesive film joints using Au/Ni bumps and flexible substrates are found to be increased by the drop impact energy and also by the combined effect of heat/humidity and the impact energy. The samples humidified at 85 °C/85% RH for 384 h, on which impact energy of 50 J was induced, exhibit the most severe results. The co...

متن کامل

A Shear Strength Degradation Model for Anisotropic Conductive Adhesive Joints Under Hygrothermal Conditions

Hygrothermal environments can degrade anisotropic conductive adhesive (ACA) joints by weakening the shear strength of adhesive interface. In this paper, the shear strength degradation model of ACA joints under hygrothermal conditions was formulated through experimental testing and theoretical modeling. The shear strength degradation data were obtained from different hygrothermal aging tests and...

متن کامل

Study of anisotropic conductive adhesive joint behavior under 3-point bending

Flip chip interconnections using anisotropic conductive film (ACF) are now a very attractive technique for electronic packaging assembly. Although ACF is environmentally friendly, many factors may influence the reliability of the final ACF joint. External mechanical loading is one of these factors. Finite element analysis (FEA) was carried out to understand the effect of mechanical loading on t...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • Microelectronics Reliability

دوره 43  شماره 

صفحات  -

تاریخ انتشار 2003