The effect of sample resistivity on Kelvin probe force microscopy
نویسندگان
چکیده
منابع مشابه
Potential Distribution in Functionalized Graphene Devices Probed by Kelvin Probe Force Microscopy
Kelvin probe force microscopy was used to study the impact of contacts and topography on the local potential distribution on contacted, individual functionalized graphene sheets (FGS) deposited on a SiO2/Si substrate. Negligible contact resistance is found at the graphene/Ti interface and a graphene resistance of 2.3 kΩ is extracted for a single sheet with sub-μm size. Pronounced steps in the t...
متن کاملThe Effect of Substrate on Structural and Electrical Properties of Cu3N Thin Film by DC Reactive Magnetron Sputtering
The aim of this paper is to study the effect of substrate on the Cu3N thin films. At first Cu3N thin films are prepared using DC magnetron sputtering system. Then structural properties, surface roughness, and electrical resistance are studied using X-ray diffraction (XRD), the atomic force microscope (AFM) and four-point probe techniques respectively. Finally, the results are investigated and c...
متن کاملLocal voltage drop in a single functionalized graphene sheet characterized by Kelvin probe force microscopy.
We studied the local voltage drop in functionalized graphene sheets of subμm size under external bias conditions by Kelvin probe force microscopy. Using this noninvasive experimental approach, we measured ohmic current-voltage characteristics and an intrinsic conductivity of about 3.7 × 10(5) S/m corresponding to a sheet resistance of 2.7 kΩ/sq under ambient conditions for graphene produced via...
متن کاملStochastic simulation of tip-sample interactions in atomic force microscopy
Related Articles The additive effect of harmonics on conservative and dissipative interactions J. Appl. Phys. 112, 124901 (2012) Note: Radiofrequency scanning probe microscopy using vertically oriented cantilevers Rev. Sci. Instrum. 83, 126103 (2012) Switching spectroscopic measurement of surface potentials on ferroelectric surfaces via an open-loop Kelvin probe force microscopy method Appl. Ph...
متن کاملThe effect of patch potentials in Casimir force measurements determined by heterodyne Kelvin probe force microscopy.
Measurements of the Casimir force require the elimination of the electrostatic force between the surfaces. However, due to electrostatic patch potentials, the voltage required to minimize the total force may not be sufficient to completely nullify the electrostatic interaction. Thus, these surface potential variations cause an additional force, which can obscure the Casimir force signal. In thi...
متن کامل