A Mim Capacitor Study of Dielectric Charging for Rf Mems Capacitive Switches
نویسندگان
چکیده
MIM capacitors are considered equally important devices for the assessment of dielectric charging in RF MEMS capacitive switches. Beside the obvious similarities between the down state condition of RF MEMS and MIM capacitors there are also some important differences. The paper aims to introduce a novel approach to the study of dielectric charging in MEMS with the aid of MIM capacitors by combining experimental results obtained by the application of DC, Charging Transient and Kelvin Probe techniques. The strengths and weaknesses are discussed in conjunction with experimental results obtained on SiNx based MIM capacitors and MEMS capacitive switches fabricated under the same conditions.
منابع مشابه
Alpha particle radiation effects in RF MEMS capacitive switches
0026-2714/$ see front matter 2008 Elsevier Ltd. A doi:10.1016/j.microrel.2008.06.047 * Corresponding author. Address: LAAS CNRS, 7, Toulouse Cedex 4, France. Tel.: +33 561337900; fax: E-mail address: [email protected] (G. Papaioannou) The paper investigates the effect of 5 MeV alpha particle irradiation in RF MEMS capacitive switches with silicon nitride dielectric film. The investigation includ...
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