High-throughput x-ray characterization system for combinatorial materials studies
نویسندگان
چکیده
We have developed a high-throughput x-ray characterization system, which can rapidly screen structure, composition and x-ray scintillation of combinatorial materials libraries using energy-dispersive x-ray diffraction, x-ray fluorescence, and x-ray photoluminescence. This system consists of an x-ray source, a polycapillary x-ray lens, one or two x-ray energy detectors, and a fiber optic spectrometer. A Windows-based software package was also developed to control the measurement system and data acquisition automatically. Examples are also demonstrated to show the applicability of this system. © 2005 American Institute of Physics. DOI: 10.1063/1.2038147
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