Stacking Faults in Co-Alloy Longitudinal Media

نویسندگان

  • B. Lu
  • Jie Zou
  • David N. Lambeth
  • David E. Laughlin
چکیده

Stacking faults in CoCrTa/Cr, CoCrPt/NiAl, and CoCrPt/Cr/NiAl films have been studied by electron diffraction. Interfacial lattice match and epitaxial growth play important roles in reducing the stacking fault density. It is found that the bicrystal media has large stacking fault densities. In the unicrystal media case, when good epitaxy between magnetic layer and underlayer cannot be achieved, there are many randomly oriented grains in the magnetic layer. These random grains have a high stacking fault density.

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تاریخ انتشار 2001