On automatic-verification pattern generation for SoC withport-order fault model

نویسندگان

  • Chun-Yao Wang
  • Shing-Wu Tung
  • Jing-Yang Jou
چکیده

Embedded cores are being increasingly used in the designs of large system-on-a-chip (SoC). Because of the high complexity of SoC, the design verification is a challenge for system integrators. To reduce the verification complexity, the port-order fault (POF) model has been used for verifying core-based designs (Tung and Jou, 1998) . In this paper, we present an automatic-verification pattern generation (AVPG) for SoC design verification based on the POF model and perform experiments on combinational and sequential benchmarks. Experimental results show that our AVPG can efficiently generate verification patterns with high POF coverage.

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عنوان ژورنال:
  • IEEE Trans. on CAD of Integrated Circuits and Systems

دوره 21  شماره 

صفحات  -

تاریخ انتشار 2002