High-resolution fracture aperture mapping using optical profilometry
نویسندگان
چکیده
[1] Fractures play an important role in the Earth’s crust, often controlling both mechanical and transport processes. Developing a mechanistic understanding of these processes requires quantifying the roughness of fracture surfaces and the contacts and void spaces between fracture surfaces at high spatial resolution (10s of microns) over a broad range of scales (centimeters to meters). Here we present a scalable method for measuring fracture surfaces and reconstructing fracture aperture fields using an optical profilometer. We evaluate the method by measuring two fractured limestone cores; one is a tensile fracture with strong cross correlation between the surfaces and the other is a saw-cut, sand-blasted fracture with negligible cross correlation between the surfaces. Results of repeated measurements of these two fractures suggest that well-correlated surfaces, where the correlation between the surfaces can aid reconstruction, can be reproduced with local uncertainties with median standard deviation of 8 m . Poorly correlated surfaces, where reconstruction relies solely upon the precision of the placement of the halves of the core on the profilometer stage, can be reproduced with local uncertainties with median standard deviation of 20 m . Additionally, we quantified the accuracy of the technique by comparing calculated aperture profiles of a fractured concrete core to thin sections cut from the core after impregnating it with epoxy. The median deviation between the two measurements, which includes errors due to residual misalignment of the profiles, was 29 m supporting the accuracy of the method. Our results emphasize the potential for using noncontact surface measurement techniques to accurately and precisely reconstruct fracture apertures over a wide range of length scales.
منابع مشابه
An overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملElectro-Optical Design of Imaging Payload for a Remote Sensing Satellite
Remote sensing using small spacecraft arising from multi-objective economic activity problems is getting more and more developed. These satellites require very accurate pointing to specific locations of interest, with high reliability and small latency. The space borne imaging systems always attempted to achieve the highest ground resolution possible with the available technology at the given t...
متن کاملFocussed ion beam machined cantilever aperture probes for near-field optical imaging.
Near-field optical probe is the key element of a near-field scanning optical microscopy (NSOM) system. The key innovation in the first two NSOM experiments (Pohl et al., 1984; Lewis et al., 1984) is the fabrications of a sub-wavelength optical aperture at the apex of a sharply pointed transparent probe tip with a thin metal coating. This paper discusses the routine use of focussed ion beam (FIB...
متن کاملMulti-spatial-frequency and phase-shifting profilometry using a liquid crystal phase modulator.
Optical profilometry is widely applied for measuring the morphology of objects by projecting predetermined patterns on them. In this technique, the compact size is one of the interesting issues for practical applications. The generation of pattern by the interference of coherent light sources has a potential to reduce the dimension...
متن کامل