Review of LP - TPG Using LP - LFSR for Switching Activities
نویسنده
چکیده
Test pattern generator (TPG) is more suitable for built in self test (BIST) structures used for testing of VLSI circuits. The objective of the BIST is to reduce power consumption, switching time and power dissipation without affecting the fault coverage. Low power linear feedback shift register (LPLFSR) is employed for TPG in order to reduce switching activities. This paper presents multiplier,LFSR,LP-TPG and BIST structure.
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