Zone Axis STEM Defect Imaging Based on Electron Kossel Patterns
نویسندگان
چکیده
orientation, i.e., with the beam direction, B , parallel to a principal zone. It was noted that the zone axis image quality, and hence defect contrast, are strongly dependent on the particular zone chosen. In this contribution, we propose that the defect image contrast quality from a given zone is directly related to the electron Kossel pattern (EKP), which is a function of crystal structure, orientation, and thickness, as well as the accelerating voltage.
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