Capillary wave fluctuations and intrinsic widths of coupled fluid-fluid interfaces: an x-ray scattering study of a wetting film on bulk liquid.

An x-ray specular reflectivity (XR) and off-specular diffuse scattering (XDS) study of the coupled thermal capillary fluctuations and the intrinsic profiles of two interacting fluid-fluid interfaces is presented. The measurements are carried out on complete wetting films of perfluoromethylcyclohexane (PFMC) on the surface of bulk liquid eicosane (C20), as a function of film thickness 30infinity), determined by either the radius of gyration (5.3 A) or the bulk correlation length (4.8 A) of the alkane C20. The intrinsic liquid-vapor interfacial width is sharper (approximately 2 A) and remains essentially constant over the entire probed range of D .