A Novel Test Coverage Metric for Concurrently-Accessed Software Components
نویسندگان
چکیده
We propose a novel, practical coverage metric called “location pairs” (LP) for concurrently-accessed software components. The LP metric captures well common concurrency errors that lead to atomicity or refinement violations. We describe a software tool for measuring LP coverage and outline an inexpensive application of predicate abstraction and model checking for ruling out infeasible coverage targets.
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