Polarization-induced Zener tunnel diodes in GaN/InGaN/GaN heterojunctions

نویسندگان

  • Xiaodong Yan
  • Wenjun Li
  • S. M. Islam
  • Kasra Pourang
  • Huili Xing
  • Patrick Fay
  • Debdeep Jena
چکیده

By the insertion of thin InxGa1!xN layers into Nitrogen-polar GaN p-n junctions, polarizationinduced Zener tunnel junctions are studied. The reverse-bias interband Zener tunneling current is found to be weakly temperature dependent, as opposed to the strongly temperature-dependent forward bias current. This indicates tunneling as the primary reverse-bias current transport mechanism. The Indium composition in the InGaN layer is systematically varied to demonstrate the increase in the interband tunneling current. Comparing the experimentally measured tunneling currents to a model helps identify the specific challenges in potentially taking such junctions towards nitride-based polarization-induced tunneling field-effect transistors. VC 2015 AIP Publishing LLC. [http://dx.doi.org/10.1063/1.4934269]

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تاریخ انتشار 2015