Empirical Analysis of the Relation between Level of Detail in UML Models and Defect Density

نویسندگان

  • Ariadi Nugroho
  • Bas Flaton
  • Michel R. V. Chaudron
چکیده

This paper investigates the relation between the level of detail (LoD) in UML models and defect density of the associated implementation. We propose LoD measures that are applicable to both classand sequence diagrams. Based on empirical data from an industrial software project we have found that classes with higher LoD, calculated using sequence diagram LoD metrics, correlates with lower defect density. Overall, this paper discusses a novel and practical approach to measure LoD in UML models and describes its application to a significant industrial case study.

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تاریخ انتشار 2008