ADC Multi-Site Test Based on a Pre-test with Digital Input Stimulus

نویسندگان

  • Xiaoqin Sheng
  • Hans G. Kerkhoff
  • Amir Zjajo
  • Guido Gronthoud
چکیده

This paper describes two novel algorithms based on the time-modulo reconstruction method intended for detection of the parametric faults in analogue-to-digital converters (ADC). In both algorithms, a pulse signal, in its slightly adapted form to allow sufficient time for converter settling, is taken as the test stimulus relieving the burden placed on the accuracy requirement of the excitation source. Instead of calculating the accurate conventional dynamic and static parameters, a signature result is obtained through the analysis of the output data in the time domain. The basic concept of the algorithms is the evaluation on the performance of ADCs by the comparison of the similarity of the output waveforms. The multi-site test is expensive for traditional specification-based tests of ADCs, as high quality analogue data generators are required. Based on these two algorithms, this paper proposes a solution for this problem. The objective of the test scheme is not to completely replace traditional specification-based tests, but to provide a reliable method for early identification of excessive parameter variations in production test that allows quickly discarding of most of the faulty circuits before performing a conventional test. The efficiency of the methods is validated on an industrial 12-bit pipelined ADC both in simulations and in measurements.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

ADC testing using digital stimuli

The Analogue-to-Digital Converter (ADC) is one of the most typical and widely used mixed-signal circuits. They are applied in video, audio, high-speed communications systems and so on. Many ADCs are integrated into platform-based designs, the architecture which normally contains of standard blocks such as memories, digital processors, RF and analogue front-ends. As testing such a system is a co...

متن کامل

Noise sensitivity of the exponential histogram ADC test

This paper deals with some error effects caused by additive noise at analogue-to-digital converters (ADCs) testing based on the histogram method and the exponential shape of input testing stimulus. The histogram method with the exponential stimulus has been an alternative test method for ADC that was developed by the authors of this paper. Here, the theoretical analysis of some errors in estima...

متن کامل

Built-In Self-Test for Static ADC Testing with a Triangle-Wave

This paper proposes a new BIST (Built-In Self-Test) method for static testing of an ADC (Analog-to-Digital Converter) with transition detection method. The proposed BIST uses a triangle-wave as an input test stimulus and calculates the ADC’s static parameters. Simulation results show that the proposed BIST can test both rising and falling transitions with minimal hardware overhead. key words: A...

متن کامل

A Blind Identification Algorithm for Digital Calibration of Pipelined Adc

A blind identification based algorithm for calibration of pipelined ADC is discussed in this paper. In contrast to traditional approaches that use one highly precise input stimulus to characterize the device, the approach adopted here is based on providing multiple inputs with nonlinearities of separated spectrum to the device-under-test (DUT). A correction code for each output of ADC is determ...

متن کامل

Improving adaptive resolution of analog to digital converters using least squares mean method

This paper presents an adaptive digital resolution improvement method for extrapolating and recursive analog-to-digital converters (ADCs). The presented adaptively enhanced ADC (AE-ADC) digitally estimates the digital equivalent of the input signal by utilizing an adaptive digital filter (ADF). The least mean squares (LMS) algorithm also determines the coefficients of the ADF block. In this sch...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:
  • J. Electronic Testing

دوره 28  شماره 

صفحات  -

تاریخ انتشار 2012