Automatic Analysis of Diffraction Fringe Patterns in Electron Miscroscopy
نویسنده
چکیده
A method for the analysis of transmission electron microscopy diffractograms for determination of the phase contrast transfer function (PCTF) is presented. This is accomplished by pattern recognition methods together with a nonlinear regression method using apriori knowledge about diffractogram shapes and results in an automatic computation of defocus and astigmatism parameters. Other applications, e. g. for Interferometry fringe analysis is possible, whenever the fringes can be described in a similar way.
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