Ultrahigh-field hole cyclotron resonance absorption in In1−xMnxAs films

نویسندگان

  • Y. H. Matsuda
  • G. A. Khodaparast
  • M. A. Zudov
  • J. Kono
  • C. J. Stanton
  • S. Katsumoto
  • H. Munekata
چکیده

We have carried out an ultrahigh-field cyclotron resonance (CR) study of p-type In1−xMnxAs films, with Mn composition x ranging from 0 to 2.5%, grown on GaAs by low-temperature molecular-beam epitaxy. Pulsed magnetic fields up to 500 T were used to make cyclotron resonance observable in these low-mobility samples. Clear CR spectra have been observed for all the samples at high fields in the megagauss range and even at room temperature. It was found that the observed cyclotron masses are not significantly dependent on the Mn concentration, indicating a large number of itinerant, effective-mass-p-type holes rather than d-like holes exist. It further suggests that the p-d exchange mechanism is more favorable than the double exchange mechanism in this narrow gap InAs-based dilute magnetic semiconductor. In addition to the fundamental heavy-hole and light-hole cyclotron resonance absorption appearing near the high-magnetic-field quantum limit, we observed many inter-Landau-level absorption bands whose transition probabilities are strongly dependent on the sense of circular polarization of the incident light. It has been found that the detailed theoretical calculation in terms of the effective mass theory explains the most of the CR spectra quantitatively, including the polarization dependence.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Theory of Cyclotron Resonance and Magneto-Optics in n- and p-Type InMnAs in Ultra-high Magnetic Fields

We present a theory for the electronic and optical properties of nand p-type In1−xMnxAs in ultra-high magnetic fields. An eight-band effective mass model based on the Pidgeon–Brown model and including the wavevector dependence of the electronic states as well as the s–d and p–d exchange interactions with Mn d-electrons is used to determine the electronic states. The optical properties such as c...

متن کامل

Determining Carrier Densities in InMnAs by Cyclotron Resonance

Accurate determination of carrier densities in ferromagnetic semiconductors by Hall measurements is hindered by the anomalous Hall effect, and thus alternative methods are being sought. Here, we propose that cyclotron resonance (CR) is an excellent method for carrier density determination for InMnAs-based magnetic structures. We develop a theory for electronic and magneto-optical properties in ...

متن کامل

Cyclotron resonance for two-dimensional electrons on thin helium films

We present a systematic investigation of the microwave absorption for two-dimensional electron layers on thin helium films and in the presence of a cyclotron resonance ~CR! magnetic field. To explain the measured data, a recently proposed two-fraction structure of the electron system is used and here described in detail. Hereby the problem of substrate roughness, usually always present for elec...

متن کامل

Relation Between Strucutral and Optical Properties of InN and InxGa1-xN Tin Films

Transmission Electron Microscopy (TEM) and optical measurements obtained from InN and In1-xGaxNfilms (0 < x < 0.54) grown by Molecular Beam Epitaxy are presented. Energy gaps measured byabsorption, PR, and PL for InN films grown on c-plane Al2O3 were in the range of 0.7 eV. No In or otherinclusions were observed in these films, ruling out the possibility of a strong Mie scattering mechanism....

متن کامل

Mn 3d electronic configurations in „Ga1−xMnx...As ferromagnetic semiconductors and their influence on magnetic ordering

We applied x-ray absorption spectroscopy and x-ray magnetic circular dichroism XMCD at the Mn 2p-3d resonances to study the Mn 3d electronic configuration and the coupling of Mn 3d magnetic moments in various Ga1−xMnxAs films. The homogeneity of the Mn depth profile throughout the Ga1−xMnxAs film was tested by additional structure-sensitive x-ray resonant reflectivity measurements. In all inves...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2004