Localization of absorption losses in oxide single-layer films
نویسندگان
چکیده
2014 Absorption measurements performed by means of photoacoustic absorption (PAA)-technique in wedge-shaped TiO2’ Ta2O5, and ZrO2 single-layer films at 03BB = 488 nm, 515 nm, and 647 nm permit a separate determination of bulk and interface absorption, respectively. For TiO2 and Ta2O5 films investigated the filmsubstrate interface absorption Afs dominates over the air-film interface absorption Aaf, whereas for evaporated ZrO2 films both the interface contributions are nearly the same. In addition, preliminary results concerned with the wavelength dependence of the absorption of the films investigated are presented. J. Physique 48 (1987) 419-424 MARS 1987, Classification Physics Abstracts 68.20 68.45 68.48 78.65 42.78H
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