Detecting Defects in Cherries Using Machine Vision
نویسندگان
چکیده
DETECTING DEFECTS IN CHERRIES USING MACHINE VISION By Patchrawat Uthaisombut This thesis describes machine vision procedures which are able to classify defective cherries from non-defective cherries. Defects can be divided into bruises, dry cracks, and wet cracks. Bandpass lters that enhance the intensity contrast between bruised and unbruised cherries are determined. An optimum combination of two wavelengths is identi ed at 750 nm (infrared range) and 500 nm (green range). An optimum single wavelength is identi ed at 750 nm. The image acquisition using these lters is described. Four detection methods using single view infrared images are studied. Two methods perform well in classifying cherries with bruises and wet cracks from nondefective cherries. One detection method using single view green images is studied. It performs well in classifying cherries with dry cracks from non-defective cherries. One detection method using infrared images and another using green images are used in combination to perform the detection on the entire surface of cherries. Two images, infrared and green, are taken from each of 6 orthogonal directions from the cherries. The integrated classi er misclassi ed 13% of non-defective cherries, 16% of bruised cherries, 0% of cherries with wet cracks, and 10% of cherries with dry cracks.
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