Control of magnetism by interfacial strain in Ni/V2O3 nanostructures

Magnetic properties of thin films can be modified through proximity effects with multilayer structures. Materials that undergo both a structural phase transition (SPT) and a metal to insulator transition (MIT) have been used for this purpose. This crystallographic change induces a stress to the adjacent layer that changes the magnetic properties of the film through magnetoelastic anisotropy. This work is devoted to the study of magnetic properties of Ni/V2O3 affected by the SPT of the V2O3. In order to achieve this goal, images obtained with synchrotron-based photoemission electron microscopy have been analyzed to spatially resolve the magnetic domains orientations and observe its evolution with an applied magnetic field. For this purpose-built algorithm has been developed and used in addition to other existing image and data analysis tools. Continuous distributions of coercitivites and magnetizations have been obtained in addition to a rather abrupt magnetic reversal mechanism.