High-Voltage Breakdown and the Gunn Effect in GaAs/AlGaAs Nanoconstrictions

نویسندگان

  • Rui Chen
  • Weilu Gao
  • Xuan Wang
  • Gregory R. Aizin
  • John Mikalopas
  • Takashi Arikawa
  • Koichiro Tanaka
  • David B. Eason
  • Gottfried Strasser
  • Junichiro Kono
  • Jonathan P. Bird
چکیده

We demonstrate dramatic breakdown behavior in the current through GaAs/AlGaAs nanoconstrictions (NCs), and find that this exhibits multiple signatures characteristic of the Gunn effect. These include current fluctuations and hysteresis, and electroluminescence that are consistent with the formation of Gunn domains. An analytical model is developed to describe the current–voltage characteristics of the NCs prior to the onset of the breakdown, and reveals the conduction through them to be barrier limited under low bias. A comparison of the results of these calculations with experiment furthermore suggests that the Gunn effect in these devices is triggered, once the phenomenon of drain-induced barrier lowering becomes sufficiently developed to support the injection of large numbers of electrons into the NC. Our paper, therefore, demonstrates how the Gunn effect may be manipulated through nanoscale tailoring of semiconductors, a result that may have implications for the development of solid-state terahertz technology.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Electroluminescence from GaAs/AlGaAs Heterostructures in Strong in-Plane Electric Fields: Evidence for k- and Real-Space Charge Transfer

In the Gunn effect, which occurs in certain semiconductors in strong electric fields, electrons are driven out of a low-mass central valley into a heavy-mass side valley in k (momentum) space, ultimately resulting in negative differential resistance (NDR). Recently, there has been interest in the possibility of exploiting this phenomenon in heterostructured semiconductors, as a means to realize...

متن کامل

Effect of Li Ion Irradiation on Reliability of AlGaAs/InGaAs/GaAs Pseudomorphic High Electron Mobility Transistor

AlGaAs/InGaAs/GaAs pHEMT (pseudomorphic high electron mobility transistors) materials and devices have been studied with 20MeV Li ions irradiation at two different fluences. The structural and electrical characteristics have been studied and compared before and after the irradiation. It has been found that with the irradiation FWHM of the material not changes as confirmed with x-ray rocking cur...

متن کامل

Using Quantized Breakdown Voltage Signals to Determine the Maximum Electric Fields in a Quantum Hall Effect Sample

We estimate the maximum values of the electric field across the width of a GaAs/AlGaAs heterostructure quantum Hall effect sample at several currents when the sample is in the breakdown regime. This estimate is accomplished by measuring the quantized longitudinal voltage drops along a length of the sample and then employing a quasielastic inter-Landau level scattering (QUILLS) model to calculat...

متن کامل

Evidence That Voltage Rather Than Resistance is Quantized in Breakdown of the Quantum Hall Effect

Quantized longitudinal voltage drops are observed along a length of a GaAs/AlGaAs heterostructure quantum Hall effect device at applied currents large enough for the device to be in the breakdown regime. The range of currents is extensive enough to demonstrate that it is the longitudinal voltage that is quantized, rather than the longitudinal resistance. A black-box and a quasi-elastic inter-La...

متن کامل

Reliability and degradation mechanism of AlGaAs/InGaAs and InAlAs/InGaAs HEMTs

The long-term stability of AlGaAs/GaAs and InAlAs/InGaAs high electron mobility transistors (HEMTs), tested under high drain voltage and/or high temperature operation is reported. HEMTs with high In content in the active channel, alternatively fabricated on InP substrates and on GaAs substrates covered by a metamorphic buffer (MHEMT), are compared. Despite the high dislocation density in the bu...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2015