Calculation of the electron Hall mobility and Hall scattering factor in 6H-SiC
نویسندگان
چکیده
The calculated electron Hall Mobility and Hall scattering factor in n-type 6H-SiC based on numerical solutions to the Boltzmann transport equation are presented. These results were obtained by solving the Boltzmann equation exactly for the electron Hall mobility using the contraction mapping principle and the electron drift mobility with Rode’s iterative method. The relative importance of the various scattering mechanisms for these calculations is discussed, and a new set of values for the acoustic deformation potential, intervalley deformation potential, and intervalley phonon energy is found, which simultaneously fit experimental Hall mobility and Hall scattering factor data. The calculated Hall mobility and Hall scattering factor are in good agreement with experimental results. In addition, predicted values of the Hall scattering factor for various temperatures and doping concentrations are given. © 2009 American Institute of Physics. doi:10.1063/1.3212532
منابع مشابه
Hall Factor Calculation for the Characterization of Transport Properties in n-channel 4H-SiC MOSFETs
For the characterization of n-channel 4H-SiC MOSFETs, current-voltage and Hall-effect measurements were carried out at room temperature. To interpret the Hall-effect measurements, the Hall factor for the electron transport in the channel of SiC MOSFETs was evaluated, for the first time. The method of the Hall factor calculation is based on the interdependence with mobility components via the re...
متن کاملSelf-consistent scattering analysis of Al0.2Ga0.8N/AlN/GaN/AlN heterostructures grown on 6H-SiC substrates using photo-Hall effect measurements
Hall effect measurements on undoped Al0.2Ga0.8N/AlN/GaN/AlN heterostructures grown on 6H-SiC substrates were carried out as a function of the temperature (30–300 K) and magnetic field (0–1.4 T). Measurements were carried out under dark and after-illumination conditions. After the dark measurements, the samples were illuminated with a blue light emitting diode for 30 min, and then the same measu...
متن کاملThe electrical transport properties in ZnO bulk, ZnMgO/ZnO and ZnMgO/ZnO/ZnMgO heterostructures
p { margin-bottom: 0.1in; direction: rtl; line-height: 120%; text-align: right; }a:link { color: rgb(0, 0, 255); } In this paper, the reported experimental data related to electrical transport properties in bulk ZnO, ZnMgO/ZnO and ZnMgO/ZnO/ZnMgO single and double heterostructures were analyzed quantitavely and the most important scattering parameters on controlling electron concentratio...
متن کاملHall effect characterization of 4H-SiC MOSFETs: Influence of nitrogen channel implantation
Effect of a shallow nitrogen implantation in the channel region of n-channel 4H-SiC Hall bar MOSFETs on their electrical properties has been characterized by Hall effect. A significant improvement of Hall mobility in normally-off devices is observed with increasing nitrogen implantation dose up to 10 13 cm -2 with a peak Hall mobility of 42.4 cm 2 .V -1 .s -1 . Coulomb scattering as dominant sc...
متن کاملEmpirical Study of Hall Bars on Few-Layer Graphene on C-Face 4H-SiC
Hall bars were fabricated on epitaxial graphene formed on 4H-SiC{0001} under various growth environments. Subsequently, they were analyzed via electrical characterization, atomic force microscopy (AFM), Raman mapping, and transmission electron microscopy (TEM) with emphasis on the C-face. The results of the measurement techniques were then corroborated to find correlations. It was found that th...
متن کامل