Direct comparison of photoemission spectroscopy and in situ Kelvin probe work function measurements on indium tin oxide films
نویسندگان
چکیده
The work function of commercially available indium tin oxide (ITO) films on glass substrates was measured using photoemission spectroscopy (PES) and ultra-high vacuum (UHV) Kelvin probe in direct comparison. Absolute Kelvin probe work function values were determined via calibration of the measured contact potential difference (CPD) using an in situ sputtered Au reference sample. The Kelvin probe data confirmed that ultraviolet photoemission spectroscopy (UPS) measurements change the work function of ITO surfaces previously exposed to ambient environment, when measured without in situ surface cleaning procedures. The results also demonstrate that both Kelvin probe and PES yield virtually identical work f f g ( p ©
منابع مشابه
Work function measurements on indium tin oxide films
We determined the work function of indium tin oxide (ITO) films on glass substrates using photoemission spectroscopy (PES). The ITO coated glass substrates were chemically cleaned ex-situ, oxygen plasma treated ex-situ, or sputtered in-situ. Our results suggest that the performance of ultraviolet photoemission spectroscopy (UPS) measurements can induce a significant work function reduction on t...
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