Study of Transmission Electron Microscopy (TEM) and Scanning Electron Microscopy (SEM)
نویسنده
چکیده
Scanning electron microscopy (SEM) and transmission electron microscopy (TEM) are widely used in material science, metallurgy sicence and life science researches. TEM is an imaging technique where a beam of electrons is focused onto a specimen causing an enlarged version to appear on a fluorescent screen or layer of photographic film. SEM is a technique of electron microscope to produce high resolution images of a sample surface. This article describes the basic principle of TEM and SEM, and their applications. [Nature and Science. 2006;4(3):14-22].
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