Ultrafast x-ray diffraction using a streak-camera detector in averaging mode.

نویسندگان

  • J Larsson
  • Z Chang
  • E Judd
  • P J Schuck
  • R W Falcone
  • P A Heimann
  • H A Padmore
  • H C Kapteyn
  • P H Bucksbaum
  • M M Murnane
  • R W Lee
  • A Machacek
  • J S Wark
  • X Liu
  • B Shan
چکیده

We demonstrate an apparatus for measuring time-dependent x-ray diffraction. X-ray pulses from a synchrotron are diffracted by a pair of Si(111) crystals and detected with an x-ray streak camera that has single-shot resolution of better than 1 ps. The streak camera is driven by a photoconductive switch, which is triggered by 100-fs laser pulses at a repetition rate of 1 kHz. The laser and the streak camera are synchronized with the synchrotron pulses. In the averaging mode, trigger jitter results in 2-ps temporal resolution. We measured the duration of 5-keV pulses from the Advanced Light Source synchrotron to be 70ps.

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عنوان ژورنال:
  • Optics letters

دوره 22 13  شماره 

صفحات  -

تاریخ انتشار 1997