Analog Circuit Fault Detection Using Relative Amplitude and Relative Phase Analysis
نویسندگان
چکیده
A new method for detection of parametric faults occurring in analog circuits based on relative amplitude and relative phase analysis of the Circuit Under Test (CUT) is proposed. The relative amplitude is the common power change of the signals and the relative phase presents the relative phase offset of the signals. In the proposed method, the value of each component of the CUT is varied within its tolerance limit using Monte Carlo simulation. The upper and lower bounds of relative amplitude and phase of the CUT sampling series are obtained. While testing, the relative amplitude and phase value of the analog circuit are obtained. If any one of the relative amplitude and phase values exceed the bounds then the CUT is declared faulty. The effectiveness of the proposed method is validated through HSpice/MATLAB simulations of two benchmark circuits and the practical circuit test of TowThomas circuit.
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