Study of Au / n - ZnSe contact by ballistic electron emission microscopy
نویسندگان
چکیده
Ballistic Electron Emission Microscopy (BEEM) has been used to characterise the Au/n-ZnSe contact. A mean statistical BEEM threshold of 1.63eV is in good agreement with literature. Metal-Insulator-Semiconductor (MIS) structures are invoked to explain the Schottky barrier height dispersion and the observed shift of BEEM thresholds to higher values.
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