Optimal interconnect diagnosis of wiring networks

نویسندگان

  • Weiping Shi
  • W. Kent Fuchs
چکیده

Interconnect diagnosis is an important problem in very large scale integration (VLSI), multi-chip module (MCM) and printed circuit board (PCB) production. The problem is to detect and locate all the shorts, opens and stuck-at faults among a set of nets using the minimum number of parallel tests. In this paper, we present worst-case optimal algorithms and lower bounds to several open problems in interconnect diagnosis. Keywords— Diagnosis, Test, Interconnect.

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عنوان ژورنال:
  • IEEE Trans. VLSI Syst.

دوره 3  شماره 

صفحات  -

تاریخ انتشار 1995