Region Mura Detection using Efficient High Pass Filtering based on Fast Average Operation
نویسندگان
چکیده
Abstract: A Mura (also called “alluck”) defect that causes local deterioration of colors or brightness on a LCD(liquid crystal display) panel is one of the critical issues in display manufacturing. In this paper, we propose mura detection method using frequency filtering. As a mean of frequency filtering to eliminate the low frequency background term, subtraction of the averaged image from the raw one is utilized. And a fast averaging algorithm has been devised for reducing computational costs. The validity and the performance of the proposed method is discussed through experimental studies on actual LCD panel mura defects.
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Automatic TFT-LCD mura defect inspection using discrete cosine transform-based background filtering and ‘just noticeable difference’ quantification strategies
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