Probing the Surface Charge on the Basal Planes of Kaolinite Particles with High-Resolution Atomic Force Microscopy
نویسندگان
چکیده
High-resolution atomic force microscopy is used to map the surface charge on the basal planes of kaolinite nanoparticles in an ambient solution of variable pH and NaCl or CaCl2 concentration. Using DLVO theory with charge regulation, we determine from the measured force-distance curves the surface charge distribution on both the silica-like and the gibbsite-like basal plane of the kaolinite particles. We observe that both basal planes do carry charge that varies with pH and salt concentration. The silica facet was found to be negatively charged at pH 4 and above, whereas the gibbsite facet is positively charged at pH below 7 and negatively charged at pH above 7. Investigations in CaCl2 at pH 6 show that the surface charge on the gibbsite facet increases for concentration up to 10 mM CaCl2 and starts to decrease upon further increasing the salt concentration to 50 mM. The increase of surface charge at low concentration is explained by Ca2+ ion adsorption, while Cl- adsorption at higher CaCl2 concentrations partially neutralizes the surface charge. Atomic resolution imaging and density functional theory calculations corroborate these observations. They show that hydrated Ca2+ ions can spontaneously adsorb on the gibbsite facet of the kaolinite particle and form ordered surface structures, while at higher concentrations Cl- ions will co-adsorb, thereby changing the observed ordered surface structure.
منابع مشابه
High Resolution Image with Multi-wall Carbon Nanotube Atomic Force Microscopy Tip (RESEARCH NOTE)
In this paper, a simple and reproducible approach for attaching the multi-wall carbon nanotubes (MWNTs) to the apex of the atomic force microscope probe has been proposed. For this purpose, the dielectrophoresis method was applied due to its simple performance, cheapness and reliability. In this method, various parameters such as voltage, frequency, concentration of carbon nanotubes solution an...
متن کاملAtomic Force Microscopy Application in Biological Research: A Review Study
Atomic force microscopy (AFM) is a three-dimensional topographic technique with a high atomic resolution to measure surface roughness. AFM is a kind of scanning probe microscope, and its near-field technique is based on the interaction between a sharp tip and the atoms of the sample surface. There are several methods and many ways to modify the tip of the AFM to investigate surface properties, ...
متن کاملExploring mechanism of xanthate adsorption on chalcopyrite surface: An atomic force microscopy study
In this work, adsorption of the potassium amyl xanthate collector on the pure chalcopyrite surface was studied by applying atomic force microscopy (AFM). The adsorption experiments were carried out at different concentrations of the collector and at diverse pH values in the presence or absence of exterior ions. The changes occurring in the surface morphology of chalcopyrite due to the collector...
متن کاملMethods for Performing Atomic Force Microscopy Imaging of Clay Minerals in a Q U E O U S Solutions
-Three methods were developed that allow for the imaging of any clay mineral in aqueous solutions with atomic force microscopy (AFM). The methods involve fixing the particles onto special substrates that do not complicate the imaging process, but hold the particles sufficiently so that they do not move laterally or float away during imaging. Two techniques depend on electrostatic attraction und...
متن کاملThe Effect of Substrate on Structural and Electrical Properties of Cu3N Thin Film by DC Reactive Magnetron Sputtering
The aim of this paper is to study the effect of substrate on the Cu3N thin films. At first Cu3N thin films are prepared using DC magnetron sputtering system. Then structural properties, surface roughness, and electrical resistance are studied using X-ray diffraction (XRD), the atomic force microscope (AFM) and four-point probe techniques respectively. Finally, the results are investigated and c...
متن کامل