Eliminating Non-Determinism During Test of High-Speed Source Synchronous Differential Buses

The at-speed functional testing of deep sub-micron devices equipped with high-speed I/O ports and the asynchronous nature of such I/O transactions poses significant challenges. In this paper, the problem of nondeterminism in the output response of the device-under-test (DUT) is described. This can arise due to limited automated test equipment (ATE) edge placement accuracy (EPA) in the source synchronous clock of the stimulus stream to the high-speed I/O port from the tester. A simple yet effective solution that uses a trigger signal to initiate a deterministic transfer of test inputs into the core clock domain of the DUT from the high-speed I/O port is presented. The solution allows the application of at-speed functional patterns to the DUT, while incurring a very small hardware overhead and trivial increase in test application time. An analysis of the probability of non-determinism as a function of clock speed and EPA is presented. It shows that as the frequency of operation of high-speed I/Os continues to rise, non-determinism will become a significant problem that can result in an unacceptable yield loss.