A New Maximal Diagnosis Algorithm for Bus-structured System

Complex interconnects in highly integrated system chips are implemented with the bus structure. From testing point of view, the bus structure system needs more complicated consideration than simple wiring networks since a bus line is received data from many drivers. Therefore, some faults are detected all the time and others are detected only at the particular time. We propose a new interconnect test algorithm for the bus structure. The MD+ algorithm supports maximal diagnosis for the busstructured system and its test period is shorter than the previous algorithms. Moreover, the MD+ algorithm is easy to apply since it is based on the complete diagnosis algorithm for wiring networks. The effectiveness of the MD+ algorithm is confirmed by comparing the test length with previous bus based interconnect test algorithms.