Low cost and highly reliable radiation hardened latch design in 65 nm CMOS technology

Low cost and highly reliable radiation hardened latch design in 65 nm

Radiation-Hardened Flip-Flops with Low Delay Overheads Using PMOS Pass-Transistors to Suppress a SET Pulse in a 65 nm FDSOI Process

We propose radiation-hardened flip-flops (FFs) based on the adaptive coupling FF (ACFF) with low dynamic power and short delay overheads in a 65 nm Fully Depleted Silicon On Insulator (FDSOI) process. We designed four FFs composed of the master latch with PMOS pass-transistors to reduce delay time overheads and the slave latch with stacked transistors for high soft-error tolerance. We evaluated...

Low-Power Soft Error Hardened Latch

This paper presents a low-power soft error-hardened latch suitable for reliable circuit operation. The proposed circuit uses redundant feedback loop to protect latch against soft error on the internal nodes, and transmission gate and Schmitt-trigger circuit to filter out transient resulting from particle hit on combinational logic. The proposed circuit has low power consumption with negative se...

A Radiation Hardened by Design Cmos Asic for Thermopile Readouts

Introduction: A radiation hardened by design (RHBD) mixed-signal application specific integrated circuit (ASIC) has been designed for a thermopile readout for operation in the harsh Jovian orbital environment. The multi-channel digitizer (MCD) ASIC (shown in Figure 1) includes 18 low noise amplifier channels which have tunable gain/filtering coefficients, a 16-bit sigma-delta analog-digital con...

SEL-UP: A CAD tool for the sensitivity analysis of radiation-induced Single Event Latch-Up

Space missions require extremely high reliable components that must guarantee correct functionality without incurring in catastrophic effects. When electronic devices are adopted in space applications, radiation hardened technology should be mandatorily adopted. In this paper we propose a novel method for analyzing the sensitivity with respect to Single Event Latch-up (SEL) in radiation hardene...