V-Transform: An Enhanced Polynomial Coefficient Based DC Test for Non-Linear Analog Circuits
نویسندگان
چکیده
DC testing of parametric faults in non-linear analog circuits based on a new transformation, entitled, V-Transform acting on polynomial coefficient expansion of the circuit function is presented. VTransform serves the dual purpose of monotonizing polynomial coefficients of circuit function expansion and increasing the sensitivity of these coefficients to circuit parameters. The sensitivity of V-Transform Coefficients (VTC) to circuit parameters is up to 3x-5x more than sensitivity of polynomial coefficients. As a case study, we consider a benchmark elliptic filter to validate our method. The technique is shown to uncover hitherto untestable parametric faults whose sizes are smaller than 10% of the nominal values.
منابع مشابه
Parametric Fault Testing of Non-Linear Analog Circuits Based on Polynomial and V-Transform Coefficients
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